Testing effort dependent software reliability model for imperfect debugging process considering both detection and correction

摘要

This paper studies the fault detection process (FDP) and fault correction process (FCP) with the incorporation of testing effort function and imperfect debugging. In order to ensure high reliability, it is essential for software to undergo a testing phase, during which faults can be detected and corrected by debuggers. The testing resource allocation during this phase, which is usually depicted by the testing effort function, considerably influences not only the fault detection rate but also the time to correct a detected fault. In addition, testing is usually far from perfect such that new faults may be introduced. In this paper, we first show how to incorporate testing effort function and fault introduction into FDP and then develop FCP as delayed FDP with a correction effort. Various specific paired FDP and FCP models are obtained based on different assumptions of fault introduction and correction effort. An illustrative example is presented. The optimal release policy under different criteria is also discussed.